Nano- and micro-structural characterization helps in understanding the relationship between physical properties and the structure of materials. The CEC offers a wide variety of
equipment: various X-ray diffraction instruments; atomic-force microscopes; environmental scanning electron microscopes (ESEM and SEM); and high-resolution transmission electron microscopes, as well as a scanning transmission X-ray microscopy (STXM), a photo-emission electron microscopy (PEEM), and X-ray nanotomography.
The CEC has 3D sensor equipment, vision systems, and a CAT scanner (for dimensional and geometrical measurements with micrometric precision). This scanner can be used to carry out non-destructive control of the internal dimensions of an object, thus enabling inspection and quality control of your assemblies. The CEC also has its own confocal microscopes and a 3D microscope that can be used to analyze surface condition (roughness parameters, with a vertical resolution of several dozen nanometers).
The CEC uses a range of proven analytical methods to measure the mechanical properties of materials and thin films – traction and hardness tests, adherence (bulge and scratch test) – and to characterize tribological properties (wear rate, friction coefficient). By analyzing mechanical and tribological performance on a nanometric scale, the experts at the CEC can help you to identify solutions and thereby improve the functionalities of your products.
The CEC proposes a number of analytical methods to identify and quantify the chemical composition of surfaces, thin films, and bulk samples. A wide variety of analytical tools requiring in-depth investigation from the outer surface, within a few nm to a depth of several millimeters, are available. Depending on the customer’s requirements, the Center selects the most appropriate technique to obtain the relevant information.